Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation
Chini, A., Di Lecce, V., Fantini, F., Meneghesso, G., Zanoni, E.Volume:
59
Year:
2012
Language:
english
Pages:
8
DOI:
10.1109/ted.2012.2188636
File:
PDF, 934 KB
english, 2012