Investigation of Abnormal Shifts Under Operating...

IEEE Transactions on Electron Devices 2012 Vol. 59; Iss. 7

Investigation of Abnormal Shifts Under Operating Conditions in Flash Memory Cells With High- Gate Stacks

Baojun Tang, Wei Dong Zhang, Jian Fu Zhang, Van den Bosch, G., Toledano-Luque, M., Govoreanu, B., Van Houdt, J.
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Volume:
59
Year:
2012
Language:
english
Pages:
1
DOI:
10.1109/ted.2012.2194294
File:
PDF, 432 KB
english, 2012
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