Direct Detection of 100–5000 eV Electrons With Delta-Doped Silicon CMOS and Electron-Multiplying CCD Imagers
Jacquot, B.C., Hoenk, M.E., Jones, T.J., Cunningham, T.J., Nikzad, S.Volume:
59
Year:
2012
Language:
english
Pages:
1
DOI:
10.1109/ted.2012.2194715
File:
PDF, 426 KB
english, 2012