Characterization and modeling of parasitic emission in deep submicron CMOS
Vrignon, B., Bendhia, S.D., Lamoureux, E., Sicard, E.Volume:
47
Year:
2005
Language:
english
Pages:
6
DOI:
10.1109/temc.2005.847408
File:
PDF, 1.15 MB
english, 2005