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Automatic Accurate Display of Capacitance-and Conductance-versus-Bias Characteristics at High Frequencies for Semiconductor Evaluation
Van Beers, P. J., Breukers, K., Faatz, J. A. W.Volume:
26
Year:
1977
Language:
english
Pages:
5
DOI:
10.1109/tim.1977.4314472
File:
PDF, 948 KB
english, 1977