Contactless Measurement of Silicon Resistivity in...

IEEE Transactions on Instrumentation and Measurement 1980 Vol. 29; Iss. 1

Contactless Measurement of Silicon Resistivity in Cylindrical TE01n Mode Cavities

Dmowski, Stanislaw, Krupka, Jerzy, Milewski, Andrzej
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Volume:
29
Year:
1980
Language:
english
Pages:
4
DOI:
10.1109/tim.1980.4314864
File:
PDF, 674 KB
english, 1980
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