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Application of the Quantized Hall Effect to a New Resistance Standard at VSL
Van Der Wel, W., Harmans, Kees J. P. M., Kaarls, Robert, Mooij, J. E.Volume:
34
Year:
1985
Language:
english
Pages:
3
DOI:
10.1109/tim.1985.4315333
File:
PDF, 625 KB
english, 1985