Entropy-based optimum test points selection for analog...

IEEE Transactions on Instrumentation and Measurement 2004 Vol. 53; Iss. 3

Entropy-based optimum test points selection for analog fault dictionary techniques

Starzyk, J.A., Dong Liu, Zhi-Hong Liu, Nelson, D.E., Rutkowski, J.O.
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Volume:
53
Year:
2004
Language:
english
Pages:
8
DOI:
10.1109/tim.2004.827085
File:
PDF, 255 KB
english, 2004
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