![](/img/cover-not-exists.png)
Why are nonlinear microwave systems measurements so involved?
Rolain, Y., Van Moer, W., Vandersteen, G., Schoukens, J.Volume:
53
Year:
2004
Language:
english
Pages:
4
DOI:
10.1109/tim.2004.827297
File:
PDF, 143 KB
english, 2004