Embedded test control schemes using iBIST for SOCs

Embedded test control schemes using iBIST for SOCs

Kay, D., Sung Chung, Mourad, S.
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Volume:
54
Year:
2005
Language:
english
Pages:
9
DOI:
10.1109/tim.2005.847349
File:
PDF, 656 KB
english, 2005
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