Comparator-based measurement scheme for dark-count rates in single photon avalanche diodes
Morath, C.P., Vaccaro, K., Buchwald, W., Clark, W.R.Volume:
54
Year:
2005
Language:
english
Pages:
7
DOI:
10.1109/tim.2005.853347
File:
PDF, 460 KB
english, 2005