Guest Editorial First Special Section of the IEEE...

Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing—Future of Semiconductor Test

Das, S.R., Rajsuman, R.
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Volume:
54
Year:
2005
Language:
english
Pages:
3
DOI:
10.1109/tim.2005.857481
File:
PDF, 41 KB
english, 2005
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