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Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing—Future of Semiconductor Test
Das, S.R., Rajsuman, R.Volume:
54
Year:
2005
Language:
english
Pages:
3
DOI:
10.1109/tim.2005.857481
File:
PDF, 41 KB
english, 2005