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A new low-cost RF built-in self-test measurement for system-on-chip transceivers
Jee-Youl Ryu, Kim, B.C., Sylla, I.Volume:
55
Year:
2006
Language:
english
Pages:
8
DOI:
10.1109/tim.2006.870317
File:
PDF, 340 KB
english, 2006