Embedded test resource for SoC to reduce required tester...

Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes

Han, Y., Xiaowei Li, Huawei Li, Chandra, A.
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Volume:
55
Year:
2006
Language:
english
Pages:
11
DOI:
10.1109/tim.2006.870332
File:
PDF, 407 KB
english, 2006
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