![](/img/cover-not-exists.png)
Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing—Future of Semiconductor Test
Das, S.R., Rajsuman, R.Volume:
55
Year:
2006
Language:
english
Pages:
3
DOI:
10.1109/tim.2006.873383
File:
PDF, 282 KB
english, 2006