Novel Methods of Fabrication and Metrology of...

IEEE Transactions on Instrumentation and Measurement 2007 Vol. 56; Iss. 2

Novel Methods of Fabrication and Metrology of Superconducting NanoStructures

Hao, L., Macfarlane, J. C., Gallop, J. C., Cox, D., Joseph-Franks, P., Hutson, D., Chen, J., Lam, S. K. H.
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Volume:
56
Year:
2007
Language:
english
Pages:
5
DOI:
10.1109/tim.2007.890593
File:
PDF, 288 KB
english, 2007
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