Confirmation of the INRiM and PTB Determinations of the Si...

IEEE Transactions on Instrumentation and Measurement 2007 Vol. 56; Iss. 2

Confirmation of the INRiM and PTB Determinations of the Si Lattice Parameter

Hao, L., Macfarlane, J.C., Gallop, J.C., Cox, D., Joseph-Franks, P., Hutson, D., Chen, J., Lam, S.K.H.
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Volume:
56
Year:
2007
Language:
english
Pages:
5
DOI:
10.1109/tim.2007.890618
File:
PDF, 359 KB
english, 2007
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