Testing Analog and Mixed-Signal Circuits With Built-In...

IEEE Transactions on Instrumentation and Measurement 2007 Vol. 56; Iss. 3

Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach

Das, S. R., Zakizadeh, J., Biswas, S., Assaf, M. H., Nayak, A. R., Petriu, E. M., Jone, W. B., Sahinoglu, M.
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Volume:
56
Year:
2007
Language:
english
Pages:
16
DOI:
10.1109/tim.2007.894223
File:
PDF, 614 KB
english, 2007
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