Accurate Software-Related Average Current Drain...

IEEE Transactions on Instrumentation and Measurement 2007 Vol. 56; Iss. 3

Accurate Software-Related Average Current Drain Measurements in Embedded Systems

Macii, D., Petri, D.
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Volume:
56
Year:
2007
Language:
english
Pages:
8
DOI:
10.1109/tim.2007.894919
File:
PDF, 329 KB
english, 2007
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