Improved Optoelectronic Technique for the Time-Domain...

IEEE Transactions on Instrumentation and Measurement 2009 Vol. 58; Iss. 4

Improved Optoelectronic Technique for the Time-Domain Characterization of Sampling Oscilloscopes

Bieler, M., Spitzer, M., Pierz, K., Siegner, U.
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Volume:
58
Year:
2009
Language:
english
Pages:
7
DOI:
10.1109/tim.2008.2009916
File:
PDF, 590 KB
english, 2009
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