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High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy
Hanqing Xing, Hanjun Jiang, Degang Chen, Geiger, R.L.Volume:
58
Year:
2009
Language:
english
Pages:
9
DOI:
10.1109/tim.2009.2015703
File:
PDF, 772 KB
english, 2009