Utilization of Target Scattering to Measure High-Level...

IEEE Transactions on Instrumentation and Measurement 2010 Vol. 59; Iss. 9

Utilization of Target Scattering to Measure High-Level Electromagnetic Fields: The MICHELSON Method

Vauchamp, S., Lalande, M., Andrieu, J., Jecko, B., Lasserre, J.L., Pecastaing, L., Cadilhon, B.
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Volume:
59
Year:
2010
Language:
english
Pages:
9
DOI:
10.1109/tim.2009.2034574
File:
PDF, 1.06 MB
english, 2010
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