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Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis
Chenglin Yang, Shulin Tian, Bing Long, Fang ChenVolume:
60
Year:
2011
Language:
english
Pages:
10
DOI:
10.1109/tim.2010.2050356
File:
PDF, 793 KB
english, 2011