Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction
Ooi, M.P.-L., Joo, E.K.J., Ye Chow Kuang, Demidenko, S., Kleeman, L., Chan, C.W.K.Volume:
60
Year:
2011
Language:
english
Pages:
18
DOI:
10.1109/tim.2011.2122430
File:
PDF, 2.46 MB
english, 2011