Multisine With Optimal Phase-Plane Uniformity for ADC...

IEEE Transactions on Instrumentation and Measurement 2012 Vol. 61; Iss. 3

Multisine With Optimal Phase-Plane Uniformity for ADC Testing

Meng Sang Ong, Ye Chow Kuang, Poon Shern Liam, Ooi, M.P.-L.
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Volume:
61
Year:
2012
Language:
english
Pages:
13
DOI:
10.1109/tim.2011.2169614
File:
PDF, 1.48 MB
english, 2012
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