Geometry optimization of TMR current sensors for on-chip IC testing
Le Phan, K., Boeve, H., Vanhelmont, F., Ikkink, T., Talen, W.Volume:
41
Year:
2005
Language:
english
Pages:
3
DOI:
10.1109/tmag.2005.854813
File:
PDF, 128 KB
english, 2005