![](/img/cover-not-exists.png)
Effect of nitrogen incorporation to oxidation process on the reliability of magnetic tunnel junctions
Kwang-Seok Kim, Ki-Su Lee, Nam, C.H., Cho, B.K.Volume:
42
Year:
2006
Language:
english
Pages:
3
DOI:
10.1109/tmag.2005.855295
File:
PDF, 116 KB
english, 2006