The behavior of pinned layers using a high-field transfer curve
Sangmun Oh, Nishioka, K., Umezaki, H., Tanaka, H., Seki, T., Sasaki, S., Ohtsu, T., Kataoka, K., Furusawa, K.Volume:
41
Year:
2005
Language:
english
Pages:
3
DOI:
10.1109/tmag.2005.855323
File:
PDF, 190 KB
english, 2005