Signal Integrity and EMC/EMI Measurement Analysis of RF...

IEEE Transactions on Magnetics 2009 Vol. 45; Iss. 3

Signal Integrity and EMC/EMI Measurement Analysis of RF MEMS Devices via a Combined FETD/Higher Order FVTD Technique

Kantartzis, N.V.
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Volume:
45
Year:
2009
Language:
english
Pages:
4
DOI:
10.1109/tmag.2009.2012645
File:
PDF, 480 KB
english, 2009
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