Nonpersistent Errors Optimization in Spin-MOS Logic and...

Nonpersistent Errors Optimization in Spin-MOS Logic and Storage Circuitry

Peiyuan Wang, Xiaobin Wang, Yaojun Zhang, Hai Li, Levitan, S.P., Yiran Chen
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Volume:
47
Year:
2011
Language:
english
Pages:
4
DOI:
10.1109/tmag.2011.2153838
File:
PDF, 553 KB
english, 2011
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