Reduction of Lift-Off Effects in Pulsed Eddy Current for Defect Classification
Yunze He, Mengchun Pan, Feilu Luo, Guiyun TianVolume:
47
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/tmag.2011.2160726
File:
PDF, 1.19 MB
english, 2011