Broad-Band Noise Mechanisms and Noise Measurements of Metal...

IEEE Transactions on Microwave Theory and Techniques 1986 Vol. 34; Iss. 11

Broad-Band Noise Mechanisms and Noise Measurements of Metal Semiconductor Junctions

Jelenski, A., Kollberg, E.L., Zirath, H.H.G.
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Volume:
34
Year:
1986
Language:
english
Pages:
9
DOI:
10.1109/tmtt.1986.1133516
File:
PDF, 996 KB
english, 1986
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