Measurement of electric-field intensities using scanning...

IEEE Transactions on Microwave Theory and Techniques 2003 Vol. 51; Iss. 11

Measurement of electric-field intensities using scanning near-field microwave microscopy

Kantor, R., Shvets, I.V.
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Volume:
51
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/tmtt.2003.818938
File:
PDF, 1.32 MB
english, 2003
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