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Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures
Feng Ling, Okhmatovski, V.I., Harris, W., McCracken, S., Aykut DengiVolume:
53
Year:
2005
Language:
english
Pages:
10
DOI:
10.1109/tmtt.2004.839907
File:
PDF, 651 KB
english, 2005