Scaling and technological limitations of 1/f noise and...

IEEE Transactions on Microwave Theory and Techniques 2005 Vol. 53; Iss. 2

Scaling and technological limitations of 1/f noise and oscillator phase noise in SiGe HBTs

Guofu Niu, Jin Tang, Zhiming Feng, Joseph, A.J., Harame, D.L.
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Volume:
53
Year:
2005
Language:
english
Pages:
9
DOI:
10.1109/tmtt.2004.840768
File:
PDF, 625 KB
english, 2005
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