A New 12-Term Open–Short–Load De-Embedding Method for...

IEEE Transactions on Microwave Theory and Techniques 2010 Vol. 58; Iss. 2

A New 12-Term Open–Short–Load De-Embedding Method for Accurate On-Wafer Characterization of RF MOSFET Structures

Tiemeijer, L.F., Pijper, R.M.T., van Steenwijk, J.A., van der Heijden, E.
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Volume:
58
Year:
2010
Language:
english
Pages:
15
DOI:
10.1109/tmtt.2009.2038453
File:
PDF, 1.51 MB
english, 2010
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