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Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications
Sheng-Chun Wang, Pin Su, Kun-Ming Chen, Kuo-Hsiang Liao, Bo-Yuan Chen, Sheng-Yi Huang, Cheng-Chou Hung, Guo-Wei HuangVolume:
58
Year:
2010
Language:
english
Pages:
7
DOI:
10.1109/tmtt.2010.2041582
File:
PDF, 1.01 MB
english, 2010