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Broadband Time-Domain Measurement System for the Characterization of Nonlinear Microwave Devices With Memory
Abouchahine, M., Saleh, A., Neveux, G., Reveyrand, T., Teyssier, J.-P., Rousset, D., Barataud, D., Nebus, J.-M.Volume:
58
Year:
2010
Language:
english
Pages:
8
DOI:
10.1109/tmtt.2010.2042503
File:
PDF, 2.54 MB
english, 2010