Characterization of GaN HEMT Low-Frequency Dispersion...

IEEE Transactions on Microwave Theory and Techniques 2010 Vol. 58; Iss. 9

Characterization of GaN HEMT Low-Frequency Dispersion Through a Multiharmonic Measurement System

Raffo, A., Di Falco, S., Vadala, V., Vannini, G.
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Volume:
58
Year:
2010
Language:
english
Pages:
7
DOI:
10.1109/tmtt.2010.2058934
File:
PDF, 1.09 MB
english, 2010
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