Two Multiport De-Embedding Methods for Accurate On-Wafer Characterization of 60-GHz Differential Amplifiers
Tiemeijer, L.F., Pijper, R.M.T., van der Heijden, E.Volume:
59
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/tmtt.2010.2095879
File:
PDF, 1.06 MB
english, 2011