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Trapping Effects in Irradiated and Avalanche-Injected MOS Capacitors
Bakowski, M., Cockrum, R. H., Zamani, N., Maserjian, J., Viswanathant, C. R.Volume:
25
Year:
1978
Language:
english
Pages:
6
DOI:
10.1109/tns.1978.4329518
File:
PDF, 1.15 MB
english, 1978