A Portable System for Upset and Transient Upset Testing of...

A Portable System for Upset and Transient Upset Testing of VLSI Circuits

Milder, F. L., Shedd, W.
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Volume:
29
Year:
1982
Language:
english
Pages:
5
DOI:
10.1109/tns.1982.4336455
File:
PDF, 673 KB
english, 1982
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