Radiation Effects on MOS Devices: Dosimetry, Annealing,...

IEEE Transactions on Nuclear Science 1983 Vol. 30; Iss. 3

Radiation Effects on MOS Devices: Dosimetry, Annealing, Irradiation Sequence, and Sources

Stassinopoulos, E. G., Brucker, G. J., Van Gunten, O., Knudson, A. R., Jordan, T. M.
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Volume:
30
Year:
1983
Language:
english
Pages:
5
DOI:
10.1109/tns.1983.4332665
File:
PDF, 1003 KB
english, 1983
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