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Snap-Back: A Stable Regenerative Breakdown Mode of MOS Devices
Ochoa, A., Sexton, F. W., Wrobel, T. F., Hash, G. L., Sokel, R. J.Volume:
30
Year:
1983
Language:
english
Pages:
4
DOI:
10.1109/tns.1983.4333094
File:
PDF, 1.18 MB
english, 1983