Radiation Testing of the CMOS 8085 Microprocessor Family

IEEE Transactions on Nuclear Science 1983 Vol. 30; Iss. 6

Radiation Testing of the CMOS 8085 Microprocessor Family

Sexton, F. W., Anderson, R. E., Corbett, W. T., Giddings, A. E., Jorgensen, J. L., Kim, W. S., Mnich, T. M., Nordstrom, T. V., Ochoa, A., Sobolewski, M. A., Treece, R. K., Wrobel, T. F.
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Volume:
30
Year:
1983
Language:
english
Pages:
5
DOI:
10.1109/tns.1983.4333114
File:
PDF, 953 KB
english, 1983
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