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The Damage Equivalence of Electrons, Protons, Alphas and Gamma Rays in Rad-Hard MOS Devices
Stassinopoulos, E. G., Van Gunten, O., Brucker, G. J., Knudson, A. R., Jordan, T. M.Volume:
30
Year:
1983
Language:
english
Pages:
5
DOI:
10.1109/tns.1983.4333138
File:
PDF, 879 KB
english, 1983