Charge Collection in Test Structures

Campbell, A. B., Knudson, A. R., Shapiro, P., Patterson, D. O., Seiberling, L. E.

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Volume:

Year:

1983

Language:

english

Pages:

DOI:

10.1109/tns.1983.4333159

File:

PDF, 1.25 MB

english, 1983

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