Charge Collection Measurements for Heavy Ions Incident on...

Charge Collection Measurements for Heavy Ions Incident on n- and p-Type Silicon

Oldham, T. R., McLean, F. B.
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Volume:
30
Year:
1983
Language:
english
Pages:
8
DOI:
10.1109/tns.1983.4333160
File:
PDF, 2.20 MB
english, 1983
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