![](/img/cover-not-exists.png)
Dose Dependence of Single Event Upset Rate in MOS dRAMS
Knudson, A. R., Campbell, A. B., Hammond, E. C.Volume:
30
Year:
1983
Language:
english
Pages:
6
DOI:
10.1109/tns.1983.4333162
File:
PDF, 1.01 MB
english, 1983