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Comparison of Analytical Models and Experimental Results for Single Event Upset in CMOS SRAMs
Mnich, T. M., Diehl, S. E., Shafer, B. D., Koga, R., Kolasinski, W. A., Ochoa, A.Volume:
30
Year:
1983
Language:
english
Pages:
4
DOI:
10.1109/tns.1983.4333184
File:
PDF, 681 KB
english, 1983